Bias Dependence of Total-Dose Effects in Bulk FinFETs

I Chatterjee, EX Zhang, BL Bhuva, MA Alles, RD Schrimpf, DM Fleetwood, Y-P Fang, A Oates

Research output: Contribution to journal › Article (Academic Journal) › peer-review

50 Citations (Scopus)

Original language	English
Journal	IEEE Transactions on Nuclear Science
Publication status	Published - 2013

Handle.net

@article{19fb8df14184473d8a6791280ba81ed0,

title = "Bias Dependence of Total-Dose Effects in Bulk FinFETs",

author = "I Chatterjee and EX Zhang and BL Bhuva and MA Alles and RD Schrimpf and DM Fleetwood and Y-P Fang and A Oates",

year = "2013",

language = "English",

journal = "IEEE Transactions on Nuclear Science",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}