Bias Dependence of Total-Dose Effects in Bulk FinFETs

I Chatterjee, EX Zhang, BL Bhuva, MA Alles, RD Schrimpf, DM Fleetwood, Y-P Fang, A Oates

Research output: Contribution to journalArticle (Academic Journal)peer-review

20 Citations (Scopus)
Original languageEnglish
JournalIEEE Transactions on Nuclear Science
Publication statusPublished - 2013

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