Biaxiality and temperature dependence of 3-and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering

N W Roberts, S Jaradat, L S Hirst, M S Thurlow, Y Wang, S T Wang, Z Q Liu, C C Huang, J Bai, R Pindak, H F Gleeson

Research output: Contribution to journalArticle (Academic Journal)peer-review

31 Citations (Scopus)

Abstract

High-resolution resonant X-ray diffraction experiments have been performed on free-standing films of two selenium-containing antiferroelectric liquid-crystal mixtures. Optical studies had indicated that both mixtures exhibit exceptionally wide intermediate phases, over a total range of >9 K. Through the structural information obtained from the resonant scattering data, we confirm that the intermediate phases of these mixtures show both 3-layer and 4-layer structural periodicities. Moreover, due to the stability of these phases, we report for the first time the temperature dependence of both the helicoidal pitch and distortion angle in the 3-layer phases deduced using the resonant X-ray technique. Analysis using an extension of the theory set out by Levelut and Pansu (Levelut A-M. and Pansu B., Phys. Rev. E, 60 (1999) 6803) shows that over the temperature ranges measured, the pitch changes linearly as a function of temperature whilst the distortion angle remains constant.

Original languageEnglish
Pages (from-to)976-982
Number of pages7
JournalEPL
Volume72
Issue number6
DOIs
Publication statusPublished - Dec 2005

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