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Blind Interference Alignment in Multi-Cell mmWave Access and Fronthaul

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2018 IEEE 88th Vehicular Technology Conference, VTC-Fall 2018 - Proceedings
Publisher or commissioning bodyInstitute of Electrical and Electronics Engineers (IEEE)
ISBN (Electronic)9781538663585
DateAccepted/In press - 28 Jun 2018
DateE-pub ahead of print - 27 Aug 2018
DatePublished (current) - 12 Apr 2019
Event2018 IEEE 88th Vehicular Technology Conference - Chicago, United States
Duration: 27 Aug 201830 Aug 2018


Conference2018 IEEE 88th Vehicular Technology Conference
Abbreviated titleVTC2018-Fall
CountryUnited States


Enhanced network capacity and reduced overhead will be some of the future communication networks requirements. In the absence of Channel State Information (CSI) at the transmitter, Blind Interference Alignment (Blind IA) has shown that optimal Degrees of Freedom (DoF) can be achieved, minimizing network's overhead. Limited spectrum is a basic issue that millimeter-Wave (mmWave) frequencies can resolve in 5G systems. Our contribution is an interference management scheme, based on Blind IA that can be employed in multi-cell, slow-fading, mmWave networks. Blind IA manages inter- and intra-cell interference by antenna selection and appropriate message scheduling. We show that our proposed scheme achieves considerably higher sum rate than TDMA, and overall outperforms TDMA in terms of Degrees of Freedom (DoF) in most cases. Also, Blind IA provides better Bit Error Rate (BER) performance and fairness, in terms of scheduling, to the network users.

    Research areas

  • beamforming, blind interference alignment, interference management, mmWave


2018 IEEE 88th Vehicular Technology Conference

Abbreviated titleVTC2018-Fall
Duration27 Aug 201830 Aug 2018
CountryUnited States

Event: Conference

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    Rights statement: This is the accepted author manuscript (AAM). The final published version (version of record) is available online via IEEE at . Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 495 KB, PDF document

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