Calibration of optically trapped nanotools

DM Carberry, SH Simpson, JA Grieve, Y Wang, H Schafer, M Steinhart, R Bowman, GM Gibson, MJ Padgett, S Hanna, MJ Miles

Research output: Contribution to journalArticle (Academic Journal)peer-review

35 Citations (Scopus)

Abstract

Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.
Translated title of the contributionCalibration of optically trapped nanotools
Original languageEnglish
Pages (from-to)175501
Number of pages7
JournalNanotechnology
Volume21
DOIs
Publication statusPublished - Apr 2010

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