Abstract
Two complementary localised density of states spectroscopies, Modulated Photo-Conductivity (MPC) and the Constant Photocurrent Method (CPM) are applied to Ga2O3 thin films and are shown to be sensitive to carrier traps above and below the Fermi level, respectively. These techniques measure the film directly, without requiring a Schottky or p-n junction, which may offer advantages over conventional techniques in the study of high-resistivity or semi-insulating materials. The benefits of a higher-resolution MPC analysis are demonstrated.
Original language | English |
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Title of host publication | 23rd International School on Condensed Matter Physics "Recent Progress in Advanced Materials and Applications" |
Subtitle of host publication | (ISCMP 2024) 26/08/2024 - 30/08/2024 Varna, Bulgaria |
Publisher | IOP Publishing |
Number of pages | 10 |
Volume | 2952 |
Edition | 1 |
DOIs | |
Publication status | Published - 17 Feb 2025 |
Publication series
Name | Journal of Physics: Conference Series |
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Publisher | IOP Publishing |
Volume | 2952 |
ISSN (Print) | 1742-6596 |
Bibliographical note
Publisher Copyright:© Published under licence by IOP Publishing Ltd.