CBED and LACBED characterization of overlapping stacking faults and microtwins

JP Morniroli; A Lefebvre; C Chou; G Lu; JW Steeds

CBED and LACBED characterization of overlapping stacking faults and microtwins

JP Morniroli, A Lefebvre, C Chou, G Lu, JW Steeds

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	CBED and LACBED characterization of overlapping stacking faults and microtwins
Original language	English
Title of host publication	Unknown
Pages	197 - 198
Number of pages	1
Volume	1
Publication status	Published - 1992

Bibliographical note

Conference Proceedings/Title of Journal: Electron Microscopy 92, Proc of the X European Congress on Elect. Microscopy, Granada 1992
Other identifier: 0

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Cite this

@inproceedings{b376a27c202049b896b14729ad42d562,

title = "CBED and LACBED characterization of overlapping stacking faults and microtwins",

author = "JP Morniroli and A Lefebvre and C Chou and G Lu and JW Steeds",

note = "Conference Proceedings/Title of Journal: Electron Microscopy 92, Proc of the X European Congress on Elect. Microscopy, Granada 1992 Other identifier: 0",

year = "1992",

language = "English",

volume = "1",

pages = "197 -- 198",

booktitle = "Unknown",

}

TY - GEN

T1 - CBED and LACBED characterization of overlapping stacking faults and microtwins

AU - Morniroli, JP

AU - Lefebvre, A

AU - Chou, C

AU - Lu, G

AU - Steeds, JW

N1 - Conference Proceedings/Title of Journal: Electron Microscopy 92, Proc of the X European Congress on Elect. Microscopy, Granada 1992 Other identifier: 0

PY - 1992

Y1 - 1992

M3 - Conference Contribution (Conference Proceeding)

VL - 1

SP - 197

EP - 198

BT - Unknown

ER -