CBED study of grain misorientations in AlGaN epilayers

S Sahonta, D Cherns, R Liu, FA Ponce, H Amano, I Akasaki

Research output: Contribution to journalArticle (Academic Journal)peer-review

Abstract

Large angle convergent beam electron diffraction (LACBED) has been used to examine AlGaN epilayers grown by facet-controlled epitaxial lateral overgrowth on GaN/(0001) sapphire substrates in prototype UV laser structures. The substrates, defined by masks with seed openings along a {10 - 10} stripe direction, had GaN seed columns with {11 - 22} surfaces. Studies were carried out on cross-sectional samples cut perpendicular to the stripe axis. An LACBED analysis of the orientation of (0002) planes, and of the {11 - 20} planes parallel to the stripe axis, revealed that the AlGaN wings were both rotated by angles of 1-2 x 10(-2) radians about the {10 - 10} stripe axis with respect to the underlying GaN, and distorted due to misfit strains. It is shown that the results are consistent with the observed structure of the AlGaN/GaN and the wing/wing boundaries, and with a new model for the generation of a-type misfit dislocations at the AlGaN/GaN interface.
Translated title of the contributionCBED study of grain misorientations in AlGaN epilayers
Original languageEnglish
Pages (from-to)23 - 32
Number of pages10
JournalUltramicroscopy
Volume103 (1)
Publication statusPublished - 2005

Bibliographical note

Publisher: Elsevier Science BV

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