TY - JOUR
T1 - Cellulose ionics
T2 - switching ionic diode responses by surface charge in reconstituted cellulose films
AU - Aaronson, Barak
AU - Wigmore, David
AU - Johns, Marcus
AU - Scott, Janet
AU - Polikarpov, Igor
AU - Marken, Frank
PY - 2017/10/7
Y1 - 2017/10/7
N2 - Cellulose films as well as chitosan-modified cellulose films of approximately 5 μm thickness, reconstituted from ionic liquid media onto a poly(ethylene-terephthalate) (PET, 6 μm thickness) film with a 5, 10, 20, or 40 μm diameter laser-drilled microhole, show significant current rectification in aqueous NaCl. Reconstituted α-cellulose films provide “cationic diodes” (due to predominant cation conductivity) whereas chitosan-doped cellulose shows “anionic diode” effects (due to predominant anion conductivity). The current rectification, or “ionic diode” behaviour, is investigated as a function of NaCl concentration, pH, microhole diameter, and molecular weight of the chitosan dopant. Future applications are envisaged exploiting the surface charge induced switching of diode currents for signal amplification in sensing.
AB - Cellulose films as well as chitosan-modified cellulose films of approximately 5 μm thickness, reconstituted from ionic liquid media onto a poly(ethylene-terephthalate) (PET, 6 μm thickness) film with a 5, 10, 20, or 40 μm diameter laser-drilled microhole, show significant current rectification in aqueous NaCl. Reconstituted α-cellulose films provide “cationic diodes” (due to predominant cation conductivity) whereas chitosan-doped cellulose shows “anionic diode” effects (due to predominant anion conductivity). The current rectification, or “ionic diode” behaviour, is investigated as a function of NaCl concentration, pH, microhole diameter, and molecular weight of the chitosan dopant. Future applications are envisaged exploiting the surface charge induced switching of diode currents for signal amplification in sensing.
U2 - 10.1039/C7AN00918F
DO - 10.1039/C7AN00918F
M3 - Article (Academic Journal)
SN - 0003-2654
VL - 142
SP - 3707
EP - 3714
JO - Analyst
JF - Analyst
IS - 19
ER -