Characterisation and modelling of nonlinear resonance behaviour on very-high-frequency silicon nanoelectromechanical resonators

Fang Ben, James Fernando, Jun-Yu Ou, Cécilia Dupré, Eric Ollier, Faezeh Arab Hassani, Hiroshi Mizuta, Yoshishige Tsuchiya

Research output: Contribution to journalArticle (Academic Journal)peer-review

Abstract

This paper reports a novel method to build a model for nonlinear resonance behaviour of very-high-frequency (VHF) silicon nanoelectromechanical (NEM) resonators, measured via 1-ω mixing resonance measurements. Systematic fitting results for the experimental data of a 1.5-μm-long beams have been achieved with explicit explanation of the amount of intrinsic mechanical nonlinearity and nonlinear voltage-tuning effect. Asymmetric line shape and onset of hysteresis on nonliner resonance behavour have been well demonstrated with less fitting errors. The development of a modelling method of nanoscale resonator devices which includes nonlinear response is beneficial for seamless technology transfer from individual devices to integrated systems in the future.
Original languageEnglish
Article number100212
JournalMicro and Nano Engineering
Volume19
DOIs
Publication statusPublished - 19 Jun 2023

Bibliographical note

Funding Information:
This work was partially supported by the EU FP7-ICT project NEMSIC [grant number 224525 ] and the CHIST-ERA grant NOEMIA [CHIST-ERA-21-NOEMS-004] by the Engineering and Physical Sciences Research Council [grant number EP/X03495X/1 ].

Publisher Copyright:
© 2023

Structured keywords

  • Photonics and Quantum

Keywords

  • Nanoelectromechanical systems
  • Nonlinear resonance
  • Mixing measurements
  • Duffing oscillator equation

Fingerprint

Dive into the research topics of 'Characterisation and modelling of nonlinear resonance behaviour on very-high-frequency silicon nanoelectromechanical resonators'. Together they form a unique fingerprint.

Cite this