Abstract
This paper reports a novel method to build a model for nonlinear resonance behaviour of very-high-frequency (VHF) silicon nanoelectromechanical (NEM) resonators, measured via 1-ω mixing resonance measurements. Systematic fitting results for the experimental data of a 1.5-μm-long beams have been achieved with explicit explanation of the amount of intrinsic mechanical nonlinearity and nonlinear voltage-tuning effect. Asymmetric line shape and onset of hysteresis on nonliner resonance behavour have been well demonstrated with less fitting errors. The development of a modelling method of nanoscale resonator devices which includes nonlinear response is beneficial for seamless technology transfer from individual devices to integrated systems in the future.
Original language | English |
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Article number | 100212 |
Journal | Micro and Nano Engineering |
Volume | 19 |
DOIs | |
Publication status | Published - 19 Jun 2023 |
Bibliographical note
Funding Information:This work was partially supported by the EU FP7-ICT project NEMSIC [grant number 224525 ] and the CHIST-ERA grant NOEMIA [CHIST-ERA-21-NOEMS-004] by the Engineering and Physical Sciences Research Council [grant number EP/X03495X/1 ].
Publisher Copyright:
© 2023
Structured keywords
- Photonics and Quantum
Keywords
- Nanoelectromechanical systems
- Nonlinear resonance
- Mixing measurements
- Duffing oscillator equation