Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy

D Cherns, JS Barnard, H Mokhtari

Research output: Contribution to journalArticle (Academic Journal)peer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Characterisation of defects and piezoelectric fields in InGaN/GaN layers by transmission electron microscopy'. Together they form a unique fingerprint.

Material Science

Engineering

Physics