Characterisation of epitaxial SiGe nanostructures by high-resolution transmission electron microscopy, large angle CBED and energy-filtered TEM

W Jaeger; D Meertens; AA Hovsepian; D Cherns; JS Barnard

Characterisation of epitaxial SiGe nanostructures by high-resolution transmission electron microscopy, large angle CBED and energy-filtered TEM

W Jaeger, D Meertens, AA Hovsepian, D Cherns, JS Barnard

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Characterisation of epitaxial SiGe nanostructures by high-resolution transmission electron microscopy, large angle CBED and energy-filtered TEM
Original language	English
Title of host publication	Unknown
Pages	116 - 116
Number of pages	1
Volume	74
Publication status	Published - 1997

Bibliographical note

Conference Proceedings/Title of Journal: European Journal of Cell Biology

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Cite this

@inproceedings{93a213a664c04f23900da5f8e5f73ad8,

title = "Characterisation of epitaxial SiGe nanostructures by high-resolution transmission electron microscopy, large angle CBED and energy-filtered TEM",

author = "W Jaeger and D Meertens and AA Hovsepian and D Cherns and JS Barnard",

note = "Conference Proceedings/Title of Journal: European Journal of Cell Biology",

year = "1997",

language = "English",

volume = "74",

pages = "116 -- 116",

booktitle = "Unknown",

}

TY - GEN

T1 - Characterisation of epitaxial SiGe nanostructures by high-resolution transmission electron microscopy, large angle CBED and energy-filtered TEM

AU - Jaeger, W

AU - Meertens, D

AU - Hovsepian, AA

AU - Cherns, D

AU - Barnard, JS

N1 - Conference Proceedings/Title of Journal: European Journal of Cell Biology

PY - 1997

Y1 - 1997

M3 - Conference Contribution (Conference Proceeding)

VL - 74

SP - 116

EP - 116

BT - Unknown

ER -