Characterization of active pixel sensors in 0.25 μm CMOS technology

JJ Velthuis, PP Allport, G Casse, A Evans, R Turchetta, M Tyndel, G Villani

Research output: Contribution to journal › Article (Academic Journal) › peer-review

14 Citations (Scopus)

Translated title of the contribution	Characterization of active pixel sensors in 0.25 μm CMOS technology
Original language	English
Pages (from-to)	1887 - 1891
Number of pages	5
Journal	IEEE Transactions on Nuclear Science
Volume	52 (5)
DOIs	https://doi.org/10.1109/TNS.2005.856915
Publication status	Published - Oct 2005

Publisher: IEEE

Access to Document

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title = "Characterization of active pixel sensors in 0.25 μm CMOS technology",

author = "JJ Velthuis and PP Allport and G Casse and A Evans and R Turchetta and M Tyndel and G Villani",

note = "Publisher: IEEE",

year = "2005",

month = oct,

doi = "10.1109/TNS.2005.856915",

language = "English",

volume = "52 (5)",

pages = "1887 -- 1891",

journal = "IEEE Transactions on Nuclear Science",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}

TY - JOUR

T1 - Characterization of active pixel sensors in 0.25 μm CMOS technology

AU - Velthuis, JJ

AU - Allport, PP

AU - Casse, G

AU - Evans, A

AU - Turchetta, R

AU - Tyndel, M

AU - Villani, G

N1 - Publisher: IEEE

PY - 2005/10

Y1 - 2005/10

U2 - 10.1109/TNS.2005.856915

DO - 10.1109/TNS.2005.856915

M3 - Article (Academic Journal)

VL - 52 (5)

SP - 1887

EP - 1891

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

ER -