Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull

M. Akmal; F. L. Ogboi; Z. Yusoff; J. Lees; V. Carrubba; H. Choi; S. Bensmida; K. Morris; M. Beach; J. McGeehan; J. Benedikt; P. J. Tasker

Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull

M. Akmal^*, F. L. Ogboi, Z. Yusoff, J. Lees, V. Carrubba, H. Choi, S. Bensmida, K. Morris, M. Beach, J. McGeehan, J. Benedikt, P. J. Tasker

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

2 Citations (Scopus)

Abstract

This paper focuses on multi-tone characterization of baseband (IF) electrical memory effects and their reduction through the application of complex-signal, active baseband load-pull. This system has been implemented to allow the precise evaluation of intrinsic nonlinearity in high-power microwave devices for wideband applications. The developed active baseband load-pull capability allows a constant, frequency independent baseband load environment to be presented across wide modulation bandwidths, and this capability is important in allowing the effects of baseband impedance variation on the performance of nonlinear microwave devices, when driven by broadband multi-tone stimuli, to be fully understood. The experimental investigations were carried out using a 10 W GaN HEMT device, under 9-carrier complex modulated excitation. These confirmed that presenting a wideband baseband short circuit was essential for maximum ACPR suppression together with the minimization of ACPR asymmetry, confirming the importance of proper termination of baseband frequency components when designing DC bias networks.

Original language	English
Title of host publication	European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012
Pages	885-888
Number of pages	4
Publication status	Published - 2012
Event	7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands Duration: 29 Oct 2012 → 30 Oct 2012

Conference

Conference	7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012
Country/Territory	Netherlands
City	Amsterdam
Period	29/10/12 → 30/10/12

Keywords

Active load-pull
adjacent channel power ratio
baseband
memory effects
power amplifiers

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Akmal, M., Ogboi, F. L., Yusoff, Z., Lees, J., Carrubba, V., Choi, H., Bensmida, S., Morris, K., Beach, M., McGeehan, J., Benedikt, J., & Tasker, P. J. (2012). Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012 (pp. 885-888). Article 6483943

@inproceedings{dbaaf551cf494f0a97fbd2da0b1f5301,

title = "Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull",

abstract = "This paper focuses on multi-tone characterization of baseband (IF) electrical memory effects and their reduction through the application of complex-signal, active baseband load-pull. This system has been implemented to allow the precise evaluation of intrinsic nonlinearity in high-power microwave devices for wideband applications. The developed active baseband load-pull capability allows a constant, frequency independent baseband load environment to be presented across wide modulation bandwidths, and this capability is important in allowing the effects of baseband impedance variation on the performance of nonlinear microwave devices, when driven by broadband multi-tone stimuli, to be fully understood. The experimental investigations were carried out using a 10 W GaN HEMT device, under 9-carrier complex modulated excitation. These confirmed that presenting a wideband baseband short circuit was essential for maximum ACPR suppression together with the minimization of ACPR asymmetry, confirming the importance of proper termination of baseband frequency components when designing DC bias networks.",

keywords = "Active load-pull, adjacent channel power ratio, baseband, memory effects, power amplifiers",

author = "M. Akmal and Ogboi, {F. L.} and Z. Yusoff and J. Lees and V. Carrubba and H. Choi and S. Bensmida and K. Morris and M. Beach and J. McGeehan and J. Benedikt and Tasker, {P. J.}",

year = "2012",

language = "English",

isbn = "9782874870286",

pages = "885--888",

booktitle = "European Microwave Week 2012: {"}Space for Microwaves{"}, EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012",

note = "7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 ; Conference date: 29-10-2012 Through 30-10-2012",

}

Akmal, M, Ogboi, FL, Yusoff, Z, Lees, J, Carrubba, V, Choi, H, Bensmida, S, Morris, K, Beach, M, McGeehan, J, Benedikt, J & Tasker, PJ 2012, Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull. in European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012., 6483943, pp. 885-888, 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012, Amsterdam, Netherlands, 29/10/12.

Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull. / Akmal, M.; Ogboi, F. L.; Yusoff, Z. et al.
European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 885-888 6483943.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull

AU - Akmal, M.

AU - Ogboi, F. L.

AU - Yusoff, Z.

AU - Lees, J.

AU - Carrubba, V.

AU - Choi, H.

AU - Bensmida, S.

AU - Morris, K.

AU - Beach, M.

AU - McGeehan, J.

AU - Benedikt, J.

AU - Tasker, P. J.

PY - 2012

Y1 - 2012

N2 - This paper focuses on multi-tone characterization of baseband (IF) electrical memory effects and their reduction through the application of complex-signal, active baseband load-pull. This system has been implemented to allow the precise evaluation of intrinsic nonlinearity in high-power microwave devices for wideband applications. The developed active baseband load-pull capability allows a constant, frequency independent baseband load environment to be presented across wide modulation bandwidths, and this capability is important in allowing the effects of baseband impedance variation on the performance of nonlinear microwave devices, when driven by broadband multi-tone stimuli, to be fully understood. The experimental investigations were carried out using a 10 W GaN HEMT device, under 9-carrier complex modulated excitation. These confirmed that presenting a wideband baseband short circuit was essential for maximum ACPR suppression together with the minimization of ACPR asymmetry, confirming the importance of proper termination of baseband frequency components when designing DC bias networks.

AB - This paper focuses on multi-tone characterization of baseband (IF) electrical memory effects and their reduction through the application of complex-signal, active baseband load-pull. This system has been implemented to allow the precise evaluation of intrinsic nonlinearity in high-power microwave devices for wideband applications. The developed active baseband load-pull capability allows a constant, frequency independent baseband load environment to be presented across wide modulation bandwidths, and this capability is important in allowing the effects of baseband impedance variation on the performance of nonlinear microwave devices, when driven by broadband multi-tone stimuli, to be fully understood. The experimental investigations were carried out using a 10 W GaN HEMT device, under 9-carrier complex modulated excitation. These confirmed that presenting a wideband baseband short circuit was essential for maximum ACPR suppression together with the minimization of ACPR asymmetry, confirming the importance of proper termination of baseband frequency components when designing DC bias networks.

KW - Active load-pull

KW - adjacent channel power ratio

KW - baseband

KW - memory effects

KW - power amplifiers

UR - http://www.scopus.com/inward/record.url?scp=84875923346&partnerID=8YFLogxK

M3 - Conference Contribution (Conference Proceeding)

AN - SCOPUS:84875923346

SN - 9782874870286

SP - 885

EP - 888

BT - European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012

T2 - 7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012

Y2 - 29 October 2012 through 30 October 2012

ER -

Akmal M, Ogboi FL, Yusoff Z, Lees J, Carrubba V, Choi H et al. Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull. In European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012. 2012. p. 885-888. 6483943

Characterization of electrical memory effects for complex multi-tone excitations using broadband active baseband load-pull

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