Characterization of poly- and single-crystal uranium-molybdenum alloy thin films

A. M. Adamska; R. Springell; T. B. Scott

doi:10.1016/j.tsf.2013.11.087

Characterization of poly- and single-crystal uranium-molybdenum alloy thin films

A. M. Adamska^*, R. Springell, T. B. Scott

^*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

11 Citations (Scopus)

Abstract

Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.

Original language	English
Pages (from-to)	319-325
Number of pages	7
Journal	Thin Solid Films
Volume	550
DOIs	https://doi.org/10.1016/j.tsf.2013.11.087
Publication status	Published - 1 Jan 2014

Keywords

Magnetron sputtering
Uranium-molybdenum alloy
Polycrystalline thin films
Single-crystal thin film microstructure
X-ray diffraction
Focus ion beam
Scanning electron microscopy
X-RAY
ALPHA-URANIUM
GAMMA-PHASE
SAPPHIRE

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10.1016/j.tsf.2013.11.087

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High-resolution scanning electron microscope (HRSEM) EP/K035746/1 and EP/K040340/1
Scott, T. B. (Principal Investigator) & Hallam, K. R. (Principal Investigator)
1/03/13 → …
Project: Research

Dr Ross S Springell
- phrssbristol.acuk
- School of Physics - Associate Professor in Actinide Physics and Nuclear Materials
- Cabot Institute for the Environment
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Cite this

@article{3e711087ac0a4a419c91b537f73d4e17,

title = "Characterization of poly- and single-crystal uranium-molybdenum alloy thin films",

abstract = "Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.",

keywords = "Magnetron sputtering, Uranium-molybdenum alloy, Polycrystalline thin films, Single-crystal thin film microstructure, X-ray diffraction, Focus ion beam, Scanning electron microscopy, X-RAY, ALPHA-URANIUM, GAMMA-PHASE, SAPPHIRE",

author = "Adamska, {A. M.} and R. Springell and Scott, {T. B.}",

year = "2014",

month = jan,

day = "1",

doi = "10.1016/j.tsf.2013.11.087",

language = "English",

volume = "550",

pages = "319--325",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Amsterdam:Elsevier",

}

TY - JOUR

T1 - Characterization of poly- and single-crystal uranium-molybdenum alloy thin films

AU - Adamska, A. M.

AU - Springell, R.

AU - Scott, T. B.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.

AB - Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.

KW - Magnetron sputtering

KW - Uranium-molybdenum alloy

KW - Polycrystalline thin films

KW - Single-crystal thin film microstructure

KW - X-ray diffraction

KW - Focus ion beam

KW - Scanning electron microscopy

KW - X-RAY

KW - ALPHA-URANIUM

KW - GAMMA-PHASE

KW - SAPPHIRE

U2 - 10.1016/j.tsf.2013.11.087

DO - 10.1016/j.tsf.2013.11.087

M3 - Article (Academic Journal)

SN - 0040-6090

VL - 550

SP - 319

EP - 325

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Characterization of poly- and single-crystal uranium-molybdenum alloy thin films

Abstract

Keywords

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Projects

High-resolution scanning electron microscope (HRSEM) EP/K035746/1 and EP/K040340/1

Profiles

Dr Ross S Springell

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