Characterization of poly- and single-crystal uranium-molybdenum alloy thin films

A. M. Adamska*, R. Springell, T. B. Scott

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

8 Citations (Scopus)

Abstract

Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.

Original languageEnglish
Pages (from-to)319-325
Number of pages7
JournalThin Solid Films
Volume550
DOIs
Publication statusPublished - 1 Jan 2014

Keywords

  • Magnetron sputtering
  • Uranium-molybdenum alloy
  • Polycrystalline thin films
  • Single-crystal thin film microstructure
  • X-ray diffraction
  • Focus ion beam
  • Scanning electron microscopy
  • X-RAY
  • ALPHA-URANIUM
  • GAMMA-PHASE
  • SAPPHIRE

Cite this