Characterization of small defects using ultrasonic arrays: a scattering coefficient matrix approach

Research output: Contribution to conferenceConference Paperpeer-review

Original languageEnglish
Publication statusPublished - 2008
Event17th World Conference on Nondestructive Testing - Shanghai, China
Duration: 10 Nov 2008 → …

Conference

Conference17th World Conference on Nondestructive Testing
Country/TerritoryChina
CityShanghai
Period10/11/08 → …

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