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Characterization of vacancy type defects in irradiated UO2 and CeO2
Marc H. Weber*, J. S. McCloy, C. R. Halverson, S. E. Karcher, R. Mohun, C. L. Corkhill
*Corresponding author for this work
Research output: Contribution to journal › Article (Academic Journal) › peer-review
4
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(Scopus)