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Closed-Form Equations for Through-Silicon Via (TSV) Parasitics in 3-D Integrated Circuits (ICs)

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Original languageUndefined/Unknown
Title of host publicationProc. Special Interest Workshop on 3D Integration -- Design Automation and Test in Europe (DATE)
Publication statusPublished - 1 Apr 2009

Research Groups and Themes

  • Photonics and Quantum

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