Compact Electrothermal Reliability Modeling and Experimental Characterization of Bipolar Latchup in SiC and CoolMOS Power MOSFETs

Roozbeh Bonyadi, Olayiwola Alatise, Saeed Jahdi, Ji Hu, Jose Angel Ortiz Gonzalez, Li Ran, Philip A. Mawby

Research output: Contribution to journalArticle (Academic Journal)peer-review

32 Citations (Scopus)
68 Downloads (Pure)

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