Comparative Cost Analysis of 3-D Integrated Circuits

Roshan Weerasekera, Dinesh Pamunuwa, Matt Grange, Axel Jantsch, Andrew Richardson, Mark Scannel

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Original language	Undefined/Unknown
Title of host publication	Proc. Special Interest Workshop on 3D Integration -- Design Automation and Test in Europe (DATE)
Publication status	Published - 1 Apr 2011

Cite this

@inproceedings{60d9c219168f4597b482007460917085,

title = "Comparative Cost Analysis of 3-D Integrated Circuits",

author = "Roshan Weerasekera and Dinesh Pamunuwa and Matt Grange and Axel Jantsch and Andrew Richardson and Mark Scannel",

year = "2011",

month = apr,

day = "1",

language = "Undefined/Unknown",

booktitle = "Proc. Special Interest Workshop on 3D Integration -- Design Automation and Test in Europe (DATE)",

}

Comparative Cost Analysis of 3-D Integrated Circuits. / Weerasekera, Roshan; Pamunuwa, Dinesh; Grange, Matt; Jantsch, Axel; Richardson, Andrew; Scannel, Mark.

Proc. Special Interest Workshop on 3D Integration -- Design Automation and Test in Europe (DATE). 2011.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Comparative Cost Analysis of 3-D Integrated Circuits

AU - Weerasekera, Roshan

AU - Pamunuwa, Dinesh

AU - Grange, Matt

AU - Jantsch, Axel

AU - Richardson, Andrew

AU - Scannel, Mark

PY - 2011/4/1

Y1 - 2011/4/1

M3 - Conference Contribution (Conference Proceeding)

BT - Proc. Special Interest Workshop on 3D Integration -- Design Automation and Test in Europe (DATE)

ER -