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Comparison of Nonlinear System Identification Methods for Free Decay Measurements with Application to MEMS Devices
Vaclav Ondra, Robin Riethmueller, Matthew R. W. Brake, Christoph W. Schwingshackl, Pavel M. Polunin, Steven W. Shaw
Research output: Chapter in Book/Report/Conference proceeding › Chapter in a book
6
Citations
(Scopus)