TY - JOUR
T1 - Comparison of optoelectrical characteristics between Schottky and Ohmic contacts to β-Ga2O3 thin film
AU - Liu, Zeng
AU - Zhi, Yusong
AU - Liu, Yuanyuan
AU - Tang, Xiao
AU - Yan, Zuyong
PY - 2020/2/20
Y1 - 2020/2/20
N2 - Schottky and Ohmic contacts are key matters affecting carrier transport in oxide semiconductor-based electrical and optical devices. For Ga2O3, the comparison of optoelectrical behaviors and the fundamental physical mechanism between these two contacts are not well known yet. In this work, β-Ga2O3 thin films were grown via metal–organic chemical vapor deposition then deposited with symmetrical Ni/Au (Schottky) or Ti/Au (Ohmic) contacts. Optoelectrical measurements show that the Ohmic contacted device exhibits superior responsivities thanks to its higher photocurrents. Meanwhile, for the Schottky contacted device, firstly, it has a faster response speed, and secondly it exhibits larger photo-to-dark current ratios owing to their low dark current. Specifically, the voltage- and light intensity-dependent responsivity and detectivities of the Schottky and Ohmic contacted devices were measured and discussed under the consideration of different voltages and UV light intensities.
AB - Schottky and Ohmic contacts are key matters affecting carrier transport in oxide semiconductor-based electrical and optical devices. For Ga2O3, the comparison of optoelectrical behaviors and the fundamental physical mechanism between these two contacts are not well known yet. In this work, β-Ga2O3 thin films were grown via metal–organic chemical vapor deposition then deposited with symmetrical Ni/Au (Schottky) or Ti/Au (Ohmic) contacts. Optoelectrical measurements show that the Ohmic contacted device exhibits superior responsivities thanks to its higher photocurrents. Meanwhile, for the Schottky contacted device, firstly, it has a faster response speed, and secondly it exhibits larger photo-to-dark current ratios owing to their low dark current. Specifically, the voltage- and light intensity-dependent responsivity and detectivities of the Schottky and Ohmic contacted devices were measured and discussed under the consideration of different voltages and UV light intensities.
U2 - 10.1088/1361-6463/ab596f
DO - 10.1088/1361-6463/ab596f
M3 - Article (Academic Journal)
SN - 0022-3727
VL - 53
JO - Journal of Physics D: Applied Physics
JF - Journal of Physics D: Applied Physics
IS - 8
M1 - 085105
ER -