Composition and strain relaxation of in x Ga1-xN graded core-shell nanorods

Queenie Soundararajah*, Richard F Webster, Ian Griffiths, Sergei Novikov, Thomas Foxon, David Cherns

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

2 Citations (Scopus)
94 Downloads (Pure)

Abstract

Two In x Ga1-xN nanorod samples with graded In compositions of x = 0.5-0 (Ga-rich) and x = 0.5-1 (In-rich) grown by molecular beam epitaxy were studied using transmission electron microscopy. The nanorods had a wurtzite crystal structure with growth along and core-shell structures with an In-rich core and Ga-rich shell. Energy-dispersive x-ray analysis confirmed grading over the entire compositional range and showed that the axial growth rate was primarily determined by the In flux, and the radial growth rate by the Ga flux. There was no evidence of misfit dislocations due to grading, but the strain due to the lattice mismatch between the In-rich core and Ga-rich shell was relaxed by edge dislocations at the core-shell interface with Burgers vectors and.

Original languageEnglish
Article number405706
Number of pages8
JournalNanotechnology
Volume29
Issue number40
Early online date30 Jul 2018
DOIs
Publication statusPublished - 5 Oct 2018

Keywords

  • core-shell structures
  • EDX mapping
  • InGaN nanorods
  • strain
  • transmission electron microscopy

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