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Abstract
The composition of InxGa(1-x)N nanorods grown by molecular beam epitaxy with nominal x = 0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a nearatomically sharp boundary between a Ga-rich shell (x similar to 0.3) and an In-rich core (x similar to 0.7), which itself has In-and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition.
Original language | English |
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Article number | 215705 |
Number of pages | 6 |
Journal | Nanotechnology |
Volume | 25 |
Issue number | 21 |
DOIs | |
Publication status | Published - 30 May 2014 |
Keywords
- InGaN nanorods
- transmission electron microscopy
- molecular beam epitaxy
- EDX mapping
- core-shell structures
- spinodal decomposition
- INGAN
- ALLOYS
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