Compositional variations in In0.5Ga0.5N nanorods grown by molecular beam epitaxy

D. Cherns*, R. F. Webster, S. V. Novikov, C. T. Foxon, A. M. Fischer, F. A. Ponce, S. J. Haigh

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

7 Citations (Scopus)

Abstract

The composition of InxGa(1-x)N nanorods grown by molecular beam epitaxy with nominal x = 0.5 has been mapped by electron microscopy using Z-contrast imaging and x-ray microanalysis. This shows a coherent and highly strained core-shell structure with a nearatomically sharp boundary between a Ga-rich shell (x similar to 0.3) and an In-rich core (x similar to 0.7), which itself has In-and Ga-rich platelets alternating along the growth axis. It is proposed that the shell and core regions are lateral and vertical growth sectors, with the core structure determined by spinodal decomposition.

Original languageEnglish
Article number215705
Number of pages6
JournalNanotechnology
Volume25
Issue number21
DOIs
Publication statusPublished - 30 May 2014

Keywords

  • InGaN nanorods
  • transmission electron microscopy
  • molecular beam epitaxy
  • EDX mapping
  • core-shell structures
  • spinodal decomposition
  • INGAN
  • ALLOYS

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