Conductive-AFM Patterning of Organic Semiconductors

Benjamin P. Brown; Loren Picco; Mervyn J. Miles; Charl F J Faul

doi:10.1002/smll.201501779

Conductive-AFM Patterning of Organic Semiconductors

Benjamin P. Brown, Loren Picco, Mervyn J. Miles^*, Charl F J Faul

^*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

12 Citations (Scopus)

405 Downloads (Pure)

Abstract

Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.

Original language	English
Pages (from-to)	5054-5058
Number of pages	5
Journal	Small
Volume	11
Issue number	38
Early online date	28 Jul 2015
DOIs	https://doi.org/10.1002/smll.201501779
Publication status	Published - 9 Oct 2015

Bibliographical note

Date of Acceptance: 25/06/2015

Keywords

AFM
conductive AFM
high-speed AFM
organic semiconductors
redox writing
tetraaniline

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10.1002/smll.201501779

Brown_et_al_2015_Small
This is the final open access, peer reviewed version of the following article: Brown, B. P., Picco, L., Miles, M. J. and Faul, C. F. J. (2015), Conductive-AFM Patterning of Organic Semiconductors. Small, 11: 5054–5058, which has been published by Wiley-VCH Verlag at doi:10.1002/smll.201501779.
Final published version, 1.11 MBLicence: CC BY

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title = "Conductive-AFM Patterning of Organic Semiconductors",

abstract = "Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.",

keywords = "AFM, conductive AFM, high-speed AFM, organic semiconductors, redox writing, tetraaniline",

author = "Brown, {Benjamin P.} and Loren Picco and Miles, {Mervyn J.} and Faul, {Charl F J}",

note = "Date of Acceptance: 25/06/2015",

year = "2015",

month = oct,

day = "9",

doi = "10.1002/smll.201501779",

language = "English",

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T1 - Conductive-AFM Patterning of Organic Semiconductors

AU - Brown, Benjamin P.

AU - Picco, Loren

AU - Miles, Mervyn J.

AU - Faul, Charl F J

N1 - Date of Acceptance: 25/06/2015

PY - 2015/10/9

Y1 - 2015/10/9

N2 - Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.

AB - Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.

KW - AFM

KW - conductive AFM

KW - high-speed AFM

KW - organic semiconductors

KW - redox writing

KW - tetraaniline

UR - http://www.scopus.com/inward/record.url?scp=84943580568&partnerID=8YFLogxK

U2 - 10.1002/smll.201501779

DO - 10.1002/smll.201501779

M3 - Article (Academic Journal)

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SN - 1613-6810

VL - 11

SP - 5054

EP - 5058

JO - Small

JF - Small

IS - 38

ER -

Conductive-AFM Patterning of Organic Semiconductors

Abstract

Bibliographical note

Keywords

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ULTRA HIGH SPEEDS NON-CONTACT FORCE MICROSCOPY

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Conductive-AFM Patterning of Organic Semiconductors

Abstract

Bibliographical note

Keywords

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ULTRA HIGH SPEEDS NON-CONTACT FORCE MICROSCOPY

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