Conductive-AFM Patterning of Organic Semiconductors

Benjamin P. Brown, Loren Picco, Mervyn J. Miles*, Charl F J Faul

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

12 Citations (Scopus)
375 Downloads (Pure)


Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.

Original languageEnglish
Pages (from-to)5054-5058
Number of pages5
Issue number38
Early online date28 Jul 2015
Publication statusPublished - 9 Oct 2015

Bibliographical note

Date of Acceptance: 25/06/2015


  • AFM
  • conductive AFM
  • high-speed AFM
  • organic semiconductors
  • redox writing
  • tetraaniline


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