Convergent beam electron diffraction and microscopy of interface atomic steps in InP/InGaAs single quantum wells

IK Jordan, D Cherns, N Grigorieff, M Hockly, PC Spurdens, MR Aylett, EG Scott

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionConvergent beam electron diffraction and microscopy of interface atomic steps in InP/InGaAs single quantum wells
Original languageEnglish
Title of host publicationUnknown
Pages563 - 568
Number of pages5
Volume117
Publication statusPublished - 1991

Bibliographical note

Conference Proceedings/Title of Journal: Inst Phys Conf Ser

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