| Translated title of the contribution | Convergent beam electron diffraction and microscopy of interface atomic steps in InP/InGaAs single quantum wells |
|---|---|
| Original language | English |
| Title of host publication | Unknown |
| Pages | 563 - 568 |
| Number of pages | 5 |
| Volume | 117 |
| Publication status | Published - 1991 |
Bibliographical note
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