Crack tip deformation fields and fatigue crack growth rates in Ti-6Al-4V

Alexander M. Korsunsky, Xu Song, Jonathan Belnoue, Terry Jun, Felix Hofmann, Paulo F. P. De Matos, David Nowell, Daniele Dini, Olivier Aparicio-Blanco, Michael J. Walsh

Research output: Contribution to journalArticle (Academic Journal)peer-review

46 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Crack tip deformation fields and fatigue crack growth rates in Ti-6Al-4V'. Together they form a unique fingerprint.

Physics & Astronomy