Crosstalk Immune Interconnect Driver Design

Roshan Weerasekera, Li-Rong Zheng, Dinesh Pamunuwa, Hannu Tenhunen

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

3 Citations (Scopus)

Abstract

The effect of crosstalk noise becomes increasingly significant as geometries continue to shrink into the deep sub-micrometer regime and clock-frequency increases into the multi GHz domain. Dynamic delay caused by coupling capacitance between adjacent interconnections is a critical problem, as it cannot accurately be estimated in static timing analysis. This work presents a new driver circuit scheme called the crosstalk immune interconnect driver (XTIID), for capacitively coupled interconnects, which eliminates pattern-dependent coupling noise. Also, such an interconnect drive technology has the potential to facilitate the dynamic timing problem in deep submicrometer VLSI design.
Original languageUndefined/Unknown
Title of host publicationProc. IEEE International Symposium on System-on-Chip (SOC)
Pages139-142
Number of pages4
DOIs
Publication statusPublished - 1 Nov 2004

Keywords

  • coupled circuits
  • crosstalk
  • driver circuits
  • integrated circuit design
  • integrated circuit interconnections
  • logic design
  • timing
  • VLSI design
  • XTIID
  • capacitively coupled interconnects
  • clock-frequency increase
  • coupling capacitance induced dynamic delay
  • crosstalk immune interconnect driver
  • crosstalk noise
  • dynamic timing analysis
  • pattern-dependent coupling noise
  • Capacitance
  • Circuit noise
  • Clocks
  • Coupling circuits
  • Crosstalk
  • Delay estimation
  • Driver circuits
  • Geometry
  • Integrated circuit interconnections
  • Timing

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