Crystallographic mapping in scanning and transmission electron microscopy with application to semiconductor materials

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Crystallographic mapping in scanning and transmission electron microscopy with application to semiconductor materials
Original language	English
Title of host publication	Electron Microscopy of Semiconducting Materials and ULSI Devices. Symposium Mater. Res. Roc., Warrendale USA
Pages	253 - 264
Publication status	Published - 1998

Handle.net

@inproceedings{3ddaae39930a4008b4fc31827442de14,

title = "Crystallographic mapping in scanning and transmission electron microscopy with application to semiconductor materials",

author = "DJ Dingley and SI Wright and DJJnr Dingley",

year = "1998",

language = "English",

pages = "253 -- 264",

booktitle = "Electron Microscopy of Semiconducting Materials and ULSI Devices. Symposium Mater. Res. Roc., Warrendale USA",

}

Crystallographic mapping in scanning and transmission electron microscopy with application to semiconductor materials. / Dingley, DJ; Wright, SI; Dingley, DJJnr.
Electron Microscopy of Semiconducting Materials and ULSI Devices. Symposium Mater. Res. Roc., Warrendale USA. 1998. p. 253 - 264.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Crystallographic mapping in scanning and transmission electron microscopy with application to semiconductor materials

AU - Dingley, DJ

AU - Wright, SI

AU - Dingley, DJJnr

PY - 1998

Y1 - 1998

M3 - Conference Contribution (Conference Proceeding)

SP - 253

EP - 264

BT - Electron Microscopy of Semiconducting Materials and ULSI Devices. Symposium Mater. Res. Roc., Warrendale USA

ER -