Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy

J-G Zheng, X Pan, M Schweizer, U Weimar, W Göpel, M Rühle

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionCrystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy
Original languageEnglish
Pages (from-to)2317 - 2324
JournalJournal of Materials Science
Volume31
Publication statusPublished - 1996

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