Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy

Crystallographic shear planes in nanocrystalline SnO₂ thin films by high-resolution transmission electron microscopy

J-G Zheng, X Pan, M Schweizer, U Weimar, W Göpel, M Rühle

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	Crystallographic shear planes in nanocrystalline SnO₂ thin films by high-resolution transmission electron microscopy
Original language	English
Pages (from-to)	2317 - 2324
Journal	Journal of Materials Science
Volume	31
Publication status	Published - 1996

@article{d1f42ed257a040fd85f7d0323f4bd8e3,

title = "Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy",

author = "J-G Zheng and X Pan and M Schweizer and U Weimar and W G{\"o}pel and M R{\"u}hle",

year = "1996",

language = "English",

volume = "31",

pages = "2317 -- 2324",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "Springer US",

}

TY - JOUR

T1 - Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy

AU - Zheng, J-G

AU - Pan, X

AU - Schweizer, M

AU - Weimar, U

AU - Göpel, W

AU - Rühle, M

PY - 1996

Y1 - 1996

M3 - Article (Academic Journal)

VL - 31

SP - 2317

EP - 2324

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

ER -