Translated title of the contribution | Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy |
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Original language | English |
Pages (from-to) | 2317 - 2324 |
Journal | Journal of Materials Science |
Volume | 31 |
Publication status | Published - 1996 |
Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy
J-G Zheng, X Pan, M Schweizer, U Weimar, W Göpel, M Rühle
Research output: Contribution to journal › Article (Academic Journal) › peer-review