DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

5 Citations (Scopus)

Abstract

2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.

Original languageEnglish
Title of host publicationREVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B
EditorsDO Thompson, DE Chimenti
Place of PublicationMELVILLE
PublisherAmerican Institute of Physics (AIP)
Pages835-842
Number of pages8
ISBN (Print)978-0-7354-0888-3
DOIs
Publication statusPublished - 2011
Event37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010) - San Diego, CA, United States
Duration: 18 Jul 201023 Jul 2010
Conference number: 37

Conference

Conference37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010)
Abbreviated titleQNDE 2010
CountryUnited States
CitySan Diego, CA
Period18/07/1023/07/10

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