DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

A. Velichko; P. D. Wilcox

doi:10.1063/1.3591934

DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

11 Citations (Scopus)

Abstract

2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.

Original language	English
Title of host publication	REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B
Editors	DO Thompson, DE Chimenti
Place of Publication	MELVILLE
Publisher	American Institute of Physics (AIP)
Pages	835-842
Number of pages	8
ISBN (Print)	978-0-7354-0888-3
DOIs	https://doi.org/10.1063/1.3591934
Publication status	Published - 2011
Event	37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010) - San Diego, CA, United States Duration: 18 Jul 2010 → 23 Jul 2010 Conference number: 37

Conference

Conference	37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010)
Abbreviated title	QNDE 2010
Country/Territory	United States
City	San Diego, CA
Period	18/07/10 → 23/07/10

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TWO-DIMENSIONAL ARRAYS FOR THE QUANTITATIVE CHARACTERISATION OF COMPLEX DEFECTS
Wilcox, P. D. (Principal Investigator)
1/03/08 → 1/03/11
Project: Research

Cite this

@inproceedings{0dbd5112b2d24baf879e9ef7d778cf0f,

title = "DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS",

abstract = "2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.",

author = "A. Velichko and Wilcox, \{P. D.\}",

year = "2011",

doi = "10.1063/1.3591934",

language = "English",

isbn = "978-0-7354-0888-3",

pages = "835--842",

editor = "DO Thompson and DE Chimenti",

booktitle = "REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B",

publisher = "American Institute of Physics (AIP)",

address = "United States",

note = "37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010), QNDE 2010 ; Conference date: 18-07-2010 Through 23-07-2010",

}

Velichko, A & Wilcox, PD 2011, DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS. in DO Thompson & DE Chimenti (eds), REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B. American Institute of Physics (AIP), MELVILLE, pp. 835-842, 37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010), San Diego, CA, United States, 18/07/10. https://doi.org/10.1063/1.3591934

DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS. / Velichko, A.; Wilcox, P. D.
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B. ed. / DO Thompson; DE Chimenti. MELVILLE: American Institute of Physics (AIP), 2011. p. 835-842.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

AU - Velichko, A.

AU - Wilcox, P. D.

N1 - Conference code: 37

PY - 2011

Y1 - 2011

N2 - 2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.

AB - 2D arrays are able to 'view' a given defect from a range of angles leading to the possibility of obtaining richer characterization detail than possible with 1D arrays. In this paper a quantitative comparison of 2D arrays with different element layouts is performed. A technique for extracting the scattering matrix of a defect from the raw 2D array data is also presented. The method is tested on experimental data for characterization of various volumetric defects.

U2 - 10.1063/1.3591934

DO - 10.1063/1.3591934

M3 - Conference Contribution (Conference Proceeding)

SN - 978-0-7354-0888-3

SP - 835

EP - 842

BT - REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 30A AND 30B

A2 - Thompson, DO

A2 - Chimenti, DE

PB - American Institute of Physics (AIP)

CY - MELVILLE

T2 - 37th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2010)

Y2 - 18 July 2010 through 23 July 2010

ER -

DEFECT CHARACTERIZATION USING TWO-DIMENSIONAL ARRAYS

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TWO-DIMENSIONAL ARRAYS FOR THE QUANTITATIVE CHARACTERISATION OF COMPLEX DEFECTS

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