Degradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering

MHH Kuball, F Demangeot, J Frandon, MA Renucci, H Sands, DN Batchelder, S Clur, O Briot

Research output: Contribution to journal › Article (Academic Journal) › peer-review

20 Citations (Scopus)

Translated title of the contribution	Degradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering
Original language	English
Pages (from-to)	549 - 551
Journal	Applied Physics Letters
Volume	74
Publication status	Published - 1999

Publisher: American Institute of Physics

Research Groups and Themes

@article{1ceb02f3f11e4488bacc0f5b1655633e,

title = "Degradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering",

author = "MHH Kuball and F Demangeot and J Frandon and MA Renucci and H Sands and DN Batchelder and S Clur and O Briot",

note = "Publisher: American Institute of Physics",

year = "1999",

language = "English",

volume = "74",

pages = "549 -- 551",

journal = "Applied Physics Letters",

issn = "1077-3118",

publisher = "American Institute of Physics (AIP)",

}

TY - JOUR

T1 - Degradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering

AU - Kuball, MHH

AU - Demangeot, F

AU - Frandon, J

AU - Renucci, MA

AU - Sands, H

AU - Batchelder, DN

AU - Clur, S

AU - Briot, O

N1 - Publisher: American Institute of Physics

PY - 1999

Y1 - 1999

M3 - Article (Academic Journal)

SN - 1077-3118

VL - 74

SP - 549

EP - 551

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -