Degradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering

MHH Kuball, F Demangeot, J Frandon, MA Renucci, H Sands, DN Batchelder, S Clur, O Briot

Research output: Contribution to journalArticle (Academic Journal)peer-review

17 Citations (Scopus)
Translated title of the contributionDegradation of AlGaN during high temperature annealing monitored by ultraviolet Raman scattering
Original languageEnglish
Pages (from-to)549 - 551
JournalApplied Physics Letters
Volume74
Publication statusPublished - 1999

Bibliographical note

Publisher: American Institute of Physics

Structured keywords

  • CDTR

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