Design of Robust Molecular Electronic Circuits

Ci Lei; Dinesh Pamunuwa; Steven Bailey; Colin Lambert

doi:10.1109/ISCAS.2009.5118131

Design of Robust Molecular Electronic Circuits

Ci Lei, Dinesh Pamunuwa, Steven Bailey, Colin Lambert

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

2 Citations (Scopus)

Abstract

A compact model for molecular electronic devices that considers the accumulation of charge on the molecule by an equivalent capacitive charging process which is suitable for transient analyses is presented. The model is used to examine the viability of molecular devices in future electronics applications. Further Monte Carlo simulations are carried out to examine digital behaviour in the face of a statistical spread in device characterising parameters, revealing relatively robust circuit behaviour and showcasing the model's capability to relate fundamental physical constants governing the quantum mechanical behavior of the device to abstract figures of merit.

Original language	Undefined/Unknown
Title of host publication	Proc. IEEE International Symposium on Circuits and Systems (ISCAS)
Pages	1819-1822
Number of pages	4
DOIs	https://doi.org/10.1109/ISCAS.2009.5118131
Publication status	Published - 1 May 2009

Keywords

Monte Carlo methods
circuit simulation
molecular electronics
transient analysis
Monte Carlo simulations
device characterising parameters
equivalent capacitive charging process
robust molecular electronic circuit
Circuit simulation
Electrons
Energy states
Integrated circuit interconnections
Molecular electronics
Physics
Robustness
Semiconductor device modeling
Very large scale integration
Voltage

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10.1109/ISCAS.2009.5118131

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Cite this

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title = "Design of Robust Molecular Electronic Circuits",

abstract = "A compact model for molecular electronic devices that considers the accumulation of charge on the molecule by an equivalent capacitive charging process which is suitable for transient analyses is presented. The model is used to examine the viability of molecular devices in future electronics applications. Further Monte Carlo simulations are carried out to examine digital behaviour in the face of a statistical spread in device characterising parameters, revealing relatively robust circuit behaviour and showcasing the model's capability to relate fundamental physical constants governing the quantum mechanical behavior of the device to abstract figures of merit.",

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N2 - A compact model for molecular electronic devices that considers the accumulation of charge on the molecule by an equivalent capacitive charging process which is suitable for transient analyses is presented. The model is used to examine the viability of molecular devices in future electronics applications. Further Monte Carlo simulations are carried out to examine digital behaviour in the face of a statistical spread in device characterising parameters, revealing relatively robust circuit behaviour and showcasing the model's capability to relate fundamental physical constants governing the quantum mechanical behavior of the device to abstract figures of merit.

AB - A compact model for molecular electronic devices that considers the accumulation of charge on the molecule by an equivalent capacitive charging process which is suitable for transient analyses is presented. The model is used to examine the viability of molecular devices in future electronics applications. Further Monte Carlo simulations are carried out to examine digital behaviour in the face of a statistical spread in device characterising parameters, revealing relatively robust circuit behaviour and showcasing the model's capability to relate fundamental physical constants governing the quantum mechanical behavior of the device to abstract figures of merit.

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KW - transient analysis

KW - Monte Carlo simulations

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KW - Circuit simulation

KW - Electrons

KW - Energy states

KW - Integrated circuit interconnections

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KW - Physics

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KW - Semiconductor device modeling

KW - Very large scale integration

KW - Voltage

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BT - Proc. IEEE International Symposium on Circuits and Systems (ISCAS)

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