Detecting Stimuli with Novel Temporal Patterns to Accelerate Functional Coverage Closure

Xuan Zheng, Tim Blackmore, James Buckingham, Kerstin Eder

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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Abstract

Novel test selectors have demonstrated their effectiveness in accelerating the closure of functional coverage for various industrial digital designs in simulation-based verification. The primary advantages of these test selectors include performance that is not impacted by coverage holes, straightforward implementation, and relatively low computational expense. However, the detection of stimuli with novel temporal patterns remains largely unexplored. This paper introduces two novel test selectors designed to identify such stimuli. The experiments reveal that both test selectors can accelerate the functional coverage for a commercial bus bridge, compared to random test selection. Specifically, one selector achieves a 26.9% reduction in the number of simulated tests required to reach 98.5% coverage, outperforming the savings achieved by two previously published test selectors by factors of 13 and 2.68, respectively.
Original languageEnglish
Title of host publication2024 IEEE International Test Conference in Asia (ITC-Asia)
Subtitle of host publication2024 IEEE International Test Conference in Asia (ITC-Asia)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages6
ISBN (Electronic)9798331540333
ISBN (Print)9798331540340
DOIs
Publication statusPublished - 10 Sept 2024
EventThe 8th International Test Conference in Asia - Huayi Brothers Movie Town, Ghangsha, China
Duration: 18 Aug 202420 Aug 2024
http://www.castest.com.cn/itcasia2024

Publication series

NameInternational Test Conference in Asia (ITC-Asia)
PublisherIEEE
ISSN (Print)2768-0681
ISSN (Electronic)2768-069X

Conference

ConferenceThe 8th International Test Conference in Asia
Country/TerritoryChina
CityGhangsha
Period18/08/2420/08/24
Internet address

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • cs.SE
  • cs.LG

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