Abstract
Novel test selectors have demonstrated their effectiveness in accelerating the closure of functional coverage for various industrial digital designs in simulation-based verification. The primary advantages of these test selectors include performance that is not impacted by coverage holes, straightforward implementation, and relatively low computational expense. However, the detection of stimuli with novel temporal patterns remains largely unexplored. This paper introduces two novel test selectors designed to identify such stimuli. The experiments reveal that both test selectors can accelerate the functional coverage for a commercial bus bridge, compared to random test selection. Specifically, one selector achieves a 26.9% reduction in the number of simulated tests required to reach 98.5% coverage, outperforming the savings achieved by two previously published test selectors by factors of 13 and 2.68, respectively.
Original language | English |
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Title of host publication | 2024 IEEE International Test Conference in Asia (ITC-Asia) |
Subtitle of host publication | 2024 IEEE International Test Conference in Asia (ITC-Asia) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Number of pages | 6 |
ISBN (Electronic) | 9798331540333 |
ISBN (Print) | 9798331540340 |
DOIs | |
Publication status | Published - 10 Sept 2024 |
Event | The 8th International Test Conference in Asia - Huayi Brothers Movie Town, Ghangsha, China Duration: 18 Aug 2024 → 20 Aug 2024 http://www.castest.com.cn/itcasia2024 |
Publication series
Name | International Test Conference in Asia (ITC-Asia) |
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Publisher | IEEE |
ISSN (Print) | 2768-0681 |
ISSN (Electronic) | 2768-069X |
Conference
Conference | The 8th International Test Conference in Asia |
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Country/Territory | China |
City | Ghangsha |
Period | 18/08/24 → 20/08/24 |
Internet address |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- cs.SE
- cs.LG