Development of a RF Waveform Stress Test Procedure for GaN HFETs Subjected to Infinite VSWR Sweeps

W. McGenn, H. Choi, J. Lees, M. J. Uren, J. Benedikt, P. J. Tasker

Research output: Contribution to journalArticle (Academic Journal)peer-review

2 Citations (Scopus)
Original languageUndefined/Unknown
JournalIEEE MTT-S International Microwave Symposium
Publication statusPublished - 2012

Cite this