| Translated title of the contribution | Development of high flux, high temperature Bonse-Hart ultra small angle X-ray scattering (USAXS) diffractometer |
|---|---|
| Original language | English |
| Pages (from-to) | 318 - 324 |
| Journal | Journal of Applied Crystallography |
| Volume | 29 |
| Publication status | Published - 1996 |
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