Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Paul May, Robert Harniman, Oliver Fox

Research output: Contribution to journalArticle (Academic Journal)

4 Citations (Scopus)
210 Downloads (Pure)

Abstract

We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.
Original languageEnglish
Pages (from-to)147-152
Number of pages6
JournalDiamond and Related Materials
Volume80
Early online date20 Sep 2017
DOIs
Publication statusPublished - Nov 2017

Keywords

  • diamond
  • TUNA
  • field emission

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