Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Paul May; Robert Harniman; Oliver Fox

doi:10.1016/j.diamond.2017.09.009

Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Paul May, Robert Harniman, Oliver Fox

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Abstract

We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

Original language	English
Pages (from-to)	147-152
Number of pages	6
Journal	Diamond and Related Materials
Volume	80
Early online date	20 Sep 2017
DOIs	https://doi.org/10.1016/j.diamond.2017.09.009
Publication status	Published - Nov 2017

Keywords

diamond
TUNA
field emission

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6 Citations
1 Article (Academic Journal)

Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy
Harniman, R., Fox, O., Janssen, W., Drijkoningen, S., Haenen, K. & May, P., Nov 2015, In: Carbon. 94, p. 386-395 10 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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52 Citations (Scopus)

387 Downloads (Pure)

1 Active

Composites Innovation from Atoms to Applications EP/K035746/1
Wisnom, M. R., Potter, K. D., Hallett, S. R., Kuball, M. H. H., Etches, J. A. & Davis, S. A.
1/03/14 → …
Project: Research

Data for paper in DRM about TUNA of flat diamond samples
May, P. W. (Creator), University of Bristol, 12 Sep 2017
DOI: 10.5523/bris.2xnbyqzab1r3c2digpw0v1o8qd, http://data.bris.ac.uk/data/dataset/2xnbyqzab1r3c2digpw0v1o8qd
Dataset

Cite this

@article{b4101fba1275421d802ae62402f9e584,

title = "Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology",

abstract = "We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.",

keywords = "diamond, TUNA, field emission",

author = "Paul May and Robert Harniman and Oliver Fox",

year = "2017",

month = nov,

doi = "10.1016/j.diamond.2017.09.009",

language = "English",

volume = "80",

pages = "147--152",

journal = "Diamond and Related Materials",

issn = "0925-9635",

publisher = "Elsevier",

}

TY - JOUR

T1 - Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

AU - May, Paul

AU - Harniman, Robert

AU - Fox, Oliver

PY - 2017/11

Y1 - 2017/11

N2 - We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

AB - We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

KW - diamond

KW - TUNA

KW - field emission

U2 - 10.1016/j.diamond.2017.09.009

DO - 10.1016/j.diamond.2017.09.009

M3 - Article (Academic Journal)

VL - 80

SP - 147

EP - 152

JO - Diamond and Related Materials

JF - Diamond and Related Materials

SN - 0925-9635

ER -

Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Abstract

Keywords

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Research output

Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy

Projects

Composites Innovation from Atoms to Applications EP/K035746/1

Datasets

Data for paper in DRM about TUNA of flat diamond samples

Cite this