Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Paul May; Robert Harniman; Oliver Fox

doi:10.1016/j.diamond.2017.09.009

Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Paul May, Robert Harniman, Oliver Fox

Research output: Contribution to journal › Article (Academic Journal) › peer-review

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Abstract

We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

Original language	English
Pages (from-to)	147-152
Number of pages	6
Journal	Diamond and Related Materials
Volume	80
Early online date	20 Sept 2017
DOIs	https://doi.org/10.1016/j.diamond.2017.09.009
Publication status	Published - Nov 2017

Research Groups and Themes

Physical & Theoretical

Keywords

diamond
TUNA
field emission

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13 Citations
1 Article (Academic Journal)

Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy
Harniman, R., Fox, O., Janssen, W., Drijkoningen, S., Haenen, K. & May, P., Nov 2015, In: Carbon. 94, p. 386-395 10 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

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58 Citations (Scopus)

442 Downloads (Pure)

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Composites Innovation from Atoms to Applications EP/K035746/1
Wisnom, M. R. (Principal Investigator), Potter, K. D. (Principal Investigator), Hallett, S. R. (Principal Investigator), Kuball, M. H. H. (Principal Investigator), Etches, J. A. (Principal Investigator) & Davis, S. A. (Co-Investigator)
1/03/14 → …
Project: Research

Data for paper in DRM about TUNA of flat diamond samples
May, P. (Creator), University of Bristol, 12 Sept 2017
DOI: 10.5523/bris.2xnbyqzab1r3c2digpw0v1o8qd, http://data.bris.ac.uk/data/dataset/2xnbyqzab1r3c2digpw0v1o8qd
Dataset

Cite this

@article{b4101fba1275421d802ae62402f9e584,

title = "Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology",

abstract = "We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.",

keywords = "diamond, TUNA, field emission",

author = "Paul May and Robert Harniman and Oliver Fox",

year = "2017",

month = nov,

doi = "10.1016/j.diamond.2017.09.009",

language = "English",

volume = "80",

pages = "147--152",

journal = "Diamond and Related Materials",

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T1 - Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

AU - May, Paul

AU - Harniman, Robert

AU - Fox, Oliver

PY - 2017/11

Y1 - 2017/11

N2 - We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

AB - We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

KW - diamond

KW - TUNA

KW - field emission

U2 - 10.1016/j.diamond.2017.09.009

DO - 10.1016/j.diamond.2017.09.009

M3 - Article (Academic Journal)

SN - 0925-9635

VL - 80

SP - 147

EP - 152

JO - Diamond and Related Materials

JF - Diamond and Related Materials

ER -

Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Abstract

Research Groups and Themes

Keywords

Access to Document

Handle.net

Embargoed Document

Fingerprint

Research output

Direct observation of electron emission from grain boundaries in CVD diamond by PeakForce-controlled tunnelling atomic force microscopy

Projects

Composites Innovation from Atoms to Applications EP/K035746/1

Datasets

Data for paper in DRM about TUNA of flat diamond samples

Cite this