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Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

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Original languageEnglish
Pages (from-to)147-152
Number of pages6
JournalDiamond and Related Materials
Volume80
Early online date20 Sep 2017
DOIs
DateAccepted/In press - 12 Sep 2017
DateE-pub ahead of print - 20 Sep 2017
DatePublished (current) - Nov 2017

Abstract

We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

    Research areas

  • diamond, TUNA, field emission

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    Rights statement: This is the final published version of the article (version of record). It first appeared online via Elsevier at http://www.sciencedirect.com/science/article/pii/S092596351730331X . Please refer to any applicable terms of use of the publisher.

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