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Direct observation of electron emission from CVD diamond grain boundaries by tunnelling atomic force microscopy independent of surface morphology

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)147-152
Number of pages6
JournalDiamond and Related Materials
Early online date20 Sep 2017
DateAccepted/In press - 12 Sep 2017
DateE-pub ahead of print - 20 Sep 2017
DatePublished (current) - Nov 2017


We present direct observation of the electron field emission sites over a large area of polycrystalline diamond using tunnelling atomic force microscopy. Any effects of surface topography have been reduced by measuring polycrystalline samples which have surface roughness values <5 nm. Measurements show that emission arises preferentially from the grain boundaries independent of the surrounding surface morphology.

    Research areas

  • diamond, TUNA, field emission

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