Dynamic Transients and Reliability of High-Voltage Silicon & 4H-SiC Bipolar Junction Transistors Under Avalanche and Short-Circuits

Mana Hosseinzadehlish, Saeed Jahdi*, Xibo Yuan, Jose Angel Ortiz Gonzalez, Olayiwola Alatise

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

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