EBIST: a novel test generator with built-in fault detection capability

D Pradhan; [No Value] Chunsheng Liu; K Chakraborty

EBIST: a novel test generator with built-in fault detection capability

D Pradhan, [No Value] Chunsheng Liu, K Chakraborty

Research output: Contribution to journal › Article (Academic Journal) › peer-review

2 Citations (Scopus)

Abstract

A novel design methodology for test pattern generation in BIST is presented. Here, faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware overhead. Also, importantly, the test patterns generated have the potential to achieve superior fault coverage.

Translated title of the contribution	EBIST: a novel test generator with built-in fault detection capability
Original language	English
Pages (from-to)	224 - 229
Number of pages	5
Journal	Design, Automation and Test in Europe Conference and Exhibition, 2003
Publication status	Published - May 2003

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@article{e0dc0d5b53354182a0cc0ede0514994e,

title = "EBIST: a novel test generator with built-in fault detection capability",

abstract = "A novel design methodology for test pattern generation in BIST is presented. Here, faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware overhead. Also, importantly, the test patterns generated have the potential to achieve superior fault coverage. ",

author = "D Pradhan and \{Chunsheng Liu\}, \{[No Value]\} and K Chakraborty",

year = "2003",

month = may,

language = "English",

pages = "224 -- 229",

journal = "Design, Automation and Test in Europe Conference and Exhibition, 2003 ",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}

TY - JOUR

T1 - EBIST: a novel test generator with built-in fault detection capability

AU - Pradhan, D

AU - Chunsheng Liu, [No Value]

AU - Chakraborty, K

PY - 2003/5

Y1 - 2003/5

N2 - A novel design methodology for test pattern generation in BIST is presented. Here, faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware overhead. Also, importantly, the test patterns generated have the potential to achieve superior fault coverage.

AB - A novel design methodology for test pattern generation in BIST is presented. Here, faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware overhead. Also, importantly, the test patterns generated have the potential to achieve superior fault coverage.

M3 - Article (Academic Journal)

SP - 224

EP - 229

JO - Design, Automation and Test in Europe Conference and Exhibition, 2003

JF - Design, Automation and Test in Europe Conference and Exhibition, 2003

ER -

EBIST: a novel test generator with built-in fault detection capability

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