EBIST: a novel test generator with built-in fault detection capability

DK Pradhan, C Liu

Department of Computer Science

Research output: Contribution to journal › Article (Academic Journal) › peer-review

10 Citations (Scopus)

1 results

Finished
LOGIC VERIFICATION, SYNTHESIS AND TEST IN A NEW UNIFIED FRAMEWORK AND LOW POWER TESTABLE DESIGNS
Pradhan, D. K. (Principal Investigator)
20/10/03 → 20/08/07
Project: Research