EBSD pattern collection and orientation mapping at normal incidence to the electron beam

DJ Dingley, JK Farrer, MM Nowell, D Dingley

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionEBSD pattern collection and orientation mapping at normal incidence to the electron beam
Original languageEnglish
Article numberSuppl.2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSupplement 2
DOIs
Publication statusPublished - 2003

Bibliographical note

Publisher: Cambridge University Press for Microscopy Society of America

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