Editorial note

Marco Ottavi*, Said Hamdioui, Sandip Kundu, Salvatore Pontarelli

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pagesii-iii
ISBN (Print)9781479961559
DOIs
Publication statusPublished - 1 Jan 2014
Event27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 - Amsterdam, United Kingdom
Duration: 1 Oct 20143 Oct 2014

Conference

Conference27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014
Country/TerritoryUnited Kingdom
CityAmsterdam
Period1/10/143/10/14

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