Editorial note

Marco Ottavi; Said Hamdioui; Sandip Kundu; Salvatore Pontarelli

doi:10.1109/DFT.2014.6962058

Editorial note

Marco Ottavi^*, Said Hamdioui, Sandip Kundu, Salvatore Pontarelli

^*Corresponding author for this work

Department of Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Original language	English
Title of host publication	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	ii-iii
ISBN (Print)	9781479961559
DOIs	https://doi.org/10.1109/DFT.2014.6962058
Publication status	Published - 1 Jan 2014
Event	27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 - Amsterdam, United Kingdom Duration: 1 Oct 2014 → 3 Oct 2014

Conference

Conference	27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014
Country/Territory	United Kingdom
City	Amsterdam
Period	1/10/14 → 3/10/14

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10.1109/DFT.2014.6962058

Cite this

@inproceedings{a7899e6943fa4d3697000b1e5553a2f6,

title = "Editorial note",

author = "Marco Ottavi and Said Hamdioui and Sandip Kundu and Salvatore Pontarelli",

year = "2014",

month = jan,

day = "1",

doi = "10.1109/DFT.2014.6962058",

language = "English",

isbn = "9781479961559",

pages = "ii--iii",

booktitle = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 ; Conference date: 01-10-2014 Through 03-10-2014",

}

Ottavi, M, Hamdioui, S, Kundu, S & Pontarelli, S 2014, Editorial note. in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems., 6962058, Institute of Electrical and Electronics Engineers (IEEE), pp. ii-iii, 27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, United Kingdom, 1/10/14. https://doi.org/10.1109/DFT.2014.6962058

Editorial note. / Ottavi, Marco; Hamdioui, Said; Kundu, Sandip; Pontarelli, Salvatore.

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Institute of Electrical and Electronics Engineers (IEEE), 2014. p. ii-iii 6962058.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Editorial note

AU - Ottavi, Marco

AU - Hamdioui, Said

AU - Kundu, Sandip

AU - Pontarelli, Salvatore

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84914693411&partnerID=8YFLogxK

U2 - 10.1109/DFT.2014.6962058

DO - 10.1109/DFT.2014.6962058

M3 - Conference Contribution (Conference Proceeding)

AN - SCOPUS:84914693411

SN - 9781479961559

SP - ii-iii

BT - Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - 27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014

Y2 - 1 October 2014 through 3 October 2014

ER -

Editorial note

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