Abstract
X-ray and neutron reflectometry studies on deposited LB films have been performed. Rocking curves have indicated accurate alignment of crystal planes parallel to the substrate. The effect of deposition speed has been investigated and found to lead to intermixing of alternating layer films at slower deposition speeds, having important implications for device fabrication.
| Original language | English |
|---|---|
| Pages (from-to) | 519-521 |
| Number of pages | 3 |
| Journal | Langmuir |
| Volume | 6 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1 Jan 1990 |
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