Effect of roughness on imaging and characterizing rough crack-like defect using ultrasonic arrays

J. Zhang*, B. W. Drinkwater, P. D. Wilcox

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)


All naturally occurring crack-like defects in solid structures are rough to some degree, which can affect defect inspection and characterization. Based on the simulated array data for various rough cracks and the total focusing method imaging algorithm, the effect of roughness on defect imaging and characterization was discussed. The array data was simulated by using the forward model combining with scattering matrices for various rough cracks. The scattering matrix describes the scattering field of a scatterer from all possible incident and scattering directions. It is shown that roughness can be either beneficial or detrimental to the detectability of a crack-like defect, depending on the defect characteristics such as length, roughness, correlation length, orientation angle, and array inspection configuration. It is also shown that roughness can cause the underestimation of length of rough crack-like defects by using the image-based approach. © 2012 American Institute of Physics.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
EditorsDO Thompson, DE Chimenti
Place of PublicationMELVILLE
PublisherAmerican Institute of Physics (AIP)
Number of pages8
ISBN (Print)978-0-7354-1013-8
Publication statusPublished - 13 Jul 2012
Event38th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2011) - Burlington, VT, United States
Duration: 17 Jul 201122 Jul 2011
Conference number: 38


Conference38th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2011)
Abbreviated titleQNDE 2011
CountryUnited States
CityBurlington, VT


  • Roughness
  • Scattering Coefficient Matrix
  • Ultrasonic Array

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