Effects of elastic relaxation on large angle convergent beam electron diffraction from cross-sectional specimens of GeSi/Si strained layer superlattices

XF Duan; D Cherns; JW Steeds

Effects of elastic relaxation on large angle convergent beam electron diffraction from cross-sectional specimens of GeSi/Si strained layer superlattices

XF Duan
, D Cherns
, JW Steeds

School of Physics

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	Effects of elastic relaxation on large angle convergent beam electron diffraction from cross-sectional specimens of GeSi/Si strained layer superlattices
Original language	English
Pages (from-to)	1091 - 1105
Number of pages	14
Journal	Phil. Mag
Volume	A70
Publication status	Published - 1994

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@article{59a948745df84fab99013c29de6672a5,

title = "Effects of elastic relaxation on large angle convergent beam electron diffraction from cross-sectional specimens of GeSi/Si strained layer superlattices",

author = "XF Duan and D Cherns and JW Steeds",

year = "1994",

language = "English",

volume = "A70",

pages = "1091 -- 1105",

journal = "Phil. Mag",

issn = "1478-6443",

publisher = "Taylor \& Francis Group",

}