Efficient Method to Tolerate Multiple Bit Upsets in SRAM Memory

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	“Efficient Method to Tolerate Multiple Bit Upsets in SRAM Memory”
Original language	English
Title of host publication	Proceedings of European Test Symposium (ETS)
Publication status	Published - 2007

Other page information: -
Conference Proceedings/Title of Journal: Proceedings of European Test Symposium (ETS)
Other identifier: 2000669

Access to Document

@inproceedings{7044fe4232a44171a03ceda5564922c9,

title = "Efficient Method to Tolerate Multiple Bit Upsets in SRAM Memory",

author = "Argyrides Costas and Zarandi H.R. and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: Proceedings of European Test Symposium (ETS) Other identifier: 2000669",

year = "2007",

language = "English",

booktitle = "Proceedings of European Test Symposium (ETS)",

}

TY - GEN

T1 - Efficient Method to Tolerate Multiple Bit Upsets in SRAM Memory

AU - Costas, Argyrides

AU - H.R., Zarandi

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: Proceedings of European Test Symposium (ETS) Other identifier: 2000669

PY - 2007

Y1 - 2007

M3 - Conference Contribution (Conference Proceeding)

BT - Proceedings of European Test Symposium (ETS)

ER -