We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsys® tool is used to generate ATPG based test patterns.
|Translated title of the contribution||Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set|
|Title of host publication||13th IEEE International On-Line Testing Symposium,Greece|
|Publication status||Published - 2007|
Bibliographical noteOther page information: -
Conference Proceedings/Title of Journal: 13th IEEE International On-Line Testing Symposium,Greece
Other identifier: 2000705