Efficient  Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set

Jimson Mathew; H. Ramahan; Pradhan Dhiraj

Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set

Jimson Mathew, H. Ramahan, Pradhan Dhiraj

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Abstract

We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsys® tool is used to generate ATPG based test patterns.

Translated title of the contribution	Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set
Original language	English
Title of host publication	13th IEEE International On-Line Testing Symposium,Greece
Publication status	Published - 2007

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: 13th IEEE International On-Line Testing Symposium,Greece
Other identifier: 2000705

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Cite this

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title = "Efficient Testable Bit Parallel Multipliers over GF(2^m) with Constant Test Set",

abstract = "We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsys{\textregistered} tool is used to generate ATPG based test patterns. ",

author = "Jimson Mathew and H. Ramahan and Pradhan Dhiraj",

note = "Other page information: - Conference Proceedings/Title of Journal: 13th IEEE International On-Line Testing Symposium,Greece Other identifier: 2000705",

year = "2007",

language = "English",

booktitle = "13th IEEE International On-Line Testing Symposium,Greece",

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AU - Mathew, Jimson

AU - Ramahan, H.

AU - Dhiraj, Pradhan

N1 - Other page information: - Conference Proceedings/Title of Journal: 13th IEEE International On-Line Testing Symposium,Greece Other identifier: 2000705

PY - 2007

Y1 - 2007

N2 - We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsys® tool is used to generate ATPG based test patterns.

AB - We present a C-testable method for detecting stuck-at (s-a) faults in the polynomial basis (PB) bit parallel multiplier circuits over GF(2m). It requires only 7 tests for detecting faults to provide 100% fault coverage, which is independent of the multiplier size. These 7 tests can be derived directly without any requirement of ATPG tools. Synopsys® tool is used to generate ATPG based test patterns.

M3 - Conference Contribution (Conference Proceeding)

BT - 13th IEEE International On-Line Testing Symposium,Greece